Actualidad
YellowScan International User Conference and Training
22-23 June 2016 | Château de Flaugergues - Montpellier, France
Registration Rates
Regular Pass: 1 day: 75€ / 2 day 125€
Presenter: FREE
More info and registration clicking here
Overview
In 2016, the YellowScan International User Conference will be hosted in the prestigious Château de Flaugergues, one of the so-called 'Follies’, built at the end of the XVII century. On top of the Chateau visit and a wine tasting workshop, attendees will have an opportunity to gain insight into current and future product plans; to hear from interesting and innovative users of YellowScan 's Lidar tools; to pick up useful tips and tricks for optimizing the application of both YellowScan Mapper and Surveyor; and to participate in the ongoing collaborative development process by providing feedback and requests to the YellowScan team.
The YellowScan User Conference provides a forum for active and prospective users of the company’s LiDAR products to network with like-minded professionals. For many, including the YellowScan staff members who attend, the highlight of YSIUC is the opportunity to hear from industry experts about their implementation experience and their success stories using YellowScan technology. Direct communication with customers has always been at the forefront of YellowScan’s business philosophy and YSIUC provides a perfect setting for this dialog. Users learn about the latest features and functions and YellowScan project managers gather information on the appropriate development strategy to best meet the needs and requirements of the user community.
What’s included ?
This exciting event is 75€ per person for one day, 125€ for two days. Lunch will be provided as well as a dinner party on the beach, a visit of the Chateau Flaugergues and a wine tasting workshop. All attendees will be entered to win a FREE YellowScan Ground Control Station license as well as other door prizes. It will be a great opportunity for networking, training, and providing input on how we can improve our products. There will be numerous GIS professionals attending to share their success stories, best practices, and real-world knowledge.
